Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon.

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Material type: Text

TextSeries: Publication details: Singapore ; Hackensack, NJ : World Scientific, c2012.Description: 312 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Vol info	Copy number	Status	Date due	Barcode
Books	University Library General Stacks	620.115 H236 (Browse shelf(Opens below))	2012	C-1	Available		113938
Books	University Library General Stacks	620.115 H236 (Browse shelf(Opens below))	2012	C-2	Available		113939

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Includes bibliographical references and index.